Materials Science 534:
Materials Characterization (4.0 units)
Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
| Section | Session | Type | Time | Days | Registered | Instructor | Location | Syllabus | Info |
|---|---|---|---|---|---|---|---|---|---|
| 32177R | 048 | Lecture | 10:00-11:50am | Mon, Wed | 0 of 15 | VHE206 |  |