Computer Science 658:
Diagnosis and Design of Reliable Digital Systems (4.0 units)
Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies; search techniques; memory testing.
- Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
| Section | Session | Type | Time | Days | Registered | Instructor | Location | Syllabus | Info |
|---|---|---|---|---|---|---|---|---|---|
| 30883R | 048 | Lecture | 11:00-2:50pm | Saturday | 16 of 40 | Moe Tabar | KAP158 |  |