Materials Science 534:

Materials Characterization (4.0 units)

Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
    SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
    32177R048Lecture2:00-3:50pmTue, Thu11 of 40Anupam MadhukarVHE217session dates
    Information accurate as of January 29, 2023 5:14 pm.
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