Materials Science 534:
Materials Characterization (4.0 units)
Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
| Section | Session | Type | Time | Days | Registered | Instructor | Location | Syllabus | Info |
|---|---|---|---|---|---|---|---|---|---|
| 32177R | 048 | Lecture | 2:00-3:50pm | Tue, Thu | 11 of 40 | Anupam Madhukar | VHE217 |  |