Electrical and Computer Engineering 534:

Materials Characterization (4.0 units)

Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
  • Crosslist: This course is offered by the MASC department but may qualify for major credit in EE. To register, enroll in MASC 534.
32177R048Lecture2:00-3:20pmTue, Thu7 of 40Anupam MadhukarONLINEPDF (1032250 MB)session dates
Information accurate as of March 10, 2022 2:00 pm.