Electrical and Computer Engineering 534:
Materials Characterization (4.0 units)
Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
- Crosslist: This course is offered by the MASC department but may qualify for major credit in EE. To register, enroll in MASC 534.
|32177R||048||Lecture||2:00-3:20pm||Tue, Thu||7 of 40||Anupam Madhukar||ONLINE||PDF (1032250 MB)|