Computer Science 658:

Diagnosis and Design of Reliable Digital Systems (3.0 units)

Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
  • Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
  • Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
30787D048Lecture6:30-9:20pmMonday74 of 80Mohammad Mirza Aghatabar AhangarGFS116feesession dates
Information accurate as of February 17, 2019 2:36 pm.